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The amorphous ZrCo films on Mo substrates with different 4He content were prepared through direct current (DC) magnetron sputtering deposition method. The atomic compositions of Zr, Co and He in Zr-Co films were measured using Rutherford backscattering (RBS) and elastic recoil detection analysis (ERDA), respectively. The helium desorption behaviors in the films were investigated. Microstructural changes...
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