Search results for: K. Hu
Journal of Materials Engineering and Performance > 2019 > 28 > 11 > 6603-6613
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 446 - 451
Thin Solid Films > 1997 > 308-309 > Complete > 443-447
Journal of Materials Engineering and Performance > 2019 > 28 > 11 > 6603-6613
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 446 - 451
Thin Solid Films > 1997 > 308-309 > Complete > 443-447