Search results for: Gilbert De Mey
Ieee transactions on components and packaging technologies > 2010 > 33 > 2 > 260 - 266
Microelectronics Journal > 2009 > 40 > 7 > 1135-1140
Integration, the VLSI Journal > 2008 > 41 > 3 > 447-458
Microelectronics Journal > 2007 > 38 > 2 > 177-184
Engineering Analysis with Boundary Elements > 2006 > 30 > 7 > 582-587
Microelectronics Reliability > 2006 > 46 > 1 > 109-115
Microelectronics Reliability > 2004 > 44 > 7 > 1181-1187
Microelectronics Journal > 2002 > 33 > 9 > 733-738
Microelectronics Reliability > 2002 > 42 > 7 > 1101-1111
Microelectronics Reliability > 2002 > 42 > 7 > 1059-1064
Microelectronics Reliability > 2002 > 42 > 4-5 > 507-510
Energy Conversion and Management > 1998 > 39 > 12 > 1239-1246
Microelectronics Journal > 1998 > 29 > 4-5 > 223-228
Microelectronics Reliability > 1998 > 38 > 3 > 443-448
Microelectronics Reliability > 1997 > 37 > 12 > 1805-1812
Engineering Analysis with Boundary Elements > 1996 > 18 > 2 > 175-178
Journal of Computational and Applied Mathematics > 1996 > 69 > 2 > 319-329