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It is challenging to quantitate micron-scale defects on the surface of large optics. Based on microscopic scattering dark-field imaging, sub-aperture scanning and stitching, the Surface Defects Evaluating System (SDES) can spot and measure scratch and digs on large optics. In order to evaluate defects of down to sub-micron over apertures of hundreds of millimeters, high magnification zoom microscope...
As an emerging and challenging learning technique, group probability classifier learning is used to train a classifier from a group probability dataset, where the class labels of each sample are unknown, but the probabilities of each class in the given data groups of the whole dataset are available. The existing work is mainly based on the inverse calibration (IC) strategy to obtain the estimated...
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