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Smooth and epitaxial thin bismuth (Bi) films with low defect density were grown on Si(001) by molecular beam epitaxy. The film quality is characterized by in situ spot profile analysis low-energy electron diffraction and scanning tunneling microscopy, and ex situ atomic force microscopy and X-ray diffraction. The complete process is accomplished in three steps. Firstly, a template of a strained 6 nm...
X-ray powder diffraction and DC magnetization studies were performed on the polycrystalline Nd 1-x Gd x Mn 2 Si 2 (0=<x=<1) compounds. Magnetic properties were examined between 5 and 700 K in applied fields up to 50 kOe. All compounds investigated crystallize in the ThCr 2 Si 2 -type structure with the space group I4/mmm. Substitution...
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