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A new method for the determination of the secondary emission yield of dielectrics is discussed. Results are given for Teflon, Aclar, Kapton, and Mylar. Surfaces of dielectrics irradiated with electrons of energies above 2 keV become negatively charged. For lower energies the number of back-scattered primaries plus backward emitted secondaries eventually exceeds that of the incoming primaries. Then...
With the widespread use of dielectric materials in high-radiation environments the behavior of the radiation-induced conductivity of dielectrics has acquired considerable importance. Numerous authors have investigated the dielectric response to short, intense bursts of radiation. The long-time behavior of the induced conductivity of insulators determines the amount of charge build-up which has been...
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