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The optical response of vacuum-evaporated Cd 1−x Zn x Te thin films in the 1.5–5.6 eV photon energy range at room temperature has been studied by spectroscopic ellipsometry. The films of Cd 1−x Zn x Te (x=0.04) were deposited at room temperature onto well-cleaned glass substrates of film thickness 450 nm. The measured dielectric-function spectra reveal distinct structures...
CdS thin films are deposited onto glass substrates by vacuum evaporation at 373K and the films are annealed at different temperatures. Rutherford backscattering spectrometry (RBS) and X-ray diffraction techniques are used to determine the thickness, composition, crystalline structure and grain size of the films. The films show a predominant hexagonal phase with small crystallites. The optical band...
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