Search results for: Anmin Hu
Materials Letters > 2012 > 78 > Complete > 72-74
Microelectronics Reliability > 2012 > 52 > 6 > 1157-1164
Microelectronics Reliability > 2012 > 52 > 3 > 585-588
Applied Surface Science > 2012 > 258 > 8 > 3643-3646
Applied Surface Science > 2011 > 257 > 22 > 9351-9354
Microelectronics Reliability > 2011 > 51 > 4 > 866-870
Microelectronics Reliability > 2011 > 51 > 3 > 636-641
Applied Surface Science > 2011 > 257 > 8 > 3723-3727
Journal of Electronic Materials > 2011 > 40 > 7 > 1556-1562
Materials Characterization > 2010 > 61 > 3 > 355-361
Applied Surface Science > 2010 > 256 > 8 > 2400-2404
Materials Characterization > 2009 > 60 > 12 > 1529-1533