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A novel method based on vibration-mode of the atomic force microscope (AFM) for nanoimaging and nanomanipulation is introduced in this paper. With this approach, the amplitude of OMSPV (opto-electronic measurement signal of probe vibration) can be used as a feedback signal to detect and control the operation state under vibration-mode. By controlling the amplitude of AFM probe, the tip-sample interaction...
Repeatable manipulation and auto-assembly of nano-scale components is a critical potential for future developments in nano optics, opto-electronics, hybrid microelectromechanical (MEMS) systems, and nano-scale devices. This paper focuses on the fabrication of nano structures using single probe with force feedback. The structures that are fabricated can be used for both rapid prototyping and for replication...
The standard application of atomic force microscope (AFM) is observation with subnanometer resolution. As development of nano-tech, AFM has also become popular as a simple manipulation tool. We have proved that developing a haptic user interface (HUI) can significantly improve these functions of AFM. When going on observation, under the assistance of HUI, the user can not only observe surface characters...
This paper focuses on nano-scale analysis of mechanical properties of polymer and carbon nanotubes (CNT) embedded MEMS devices using the probe tip of the atomic force microscope (AFM). The mechanical properties of surfaces of layered materials were investigated by using nanoindentation produced with tips of an AFM. Experiment results indicated the bending characteristics of the device and could also...
This paper described an integrated system with an atomic force microscope designed for nanomanipulation. Simulation of the nanomanipulation process was accomplished by estimating the interactive forces between molecules of the AFM tip and the sample based on the principle of contact mechanics. The intermolecular force and interactive force between the tip and sample are modeled by the Lennard-Jones...
This paper describes a virtual reality and haptic interface between human and the atomic force microscope (AFM), which allows the operator to sense and touch the surface and nanoparticles during the manipulation with an AFM tip. The tip-sample interaction forces and intermolecular forces between the tip and surface are modeled based on Lennard-Jones potential and JKR theory, respectively. Our objective...
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