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This work presents a study on the substrate noise coupling between two interconnects. A highly, a lightly and a uniformly doped substrate, approximating most modern technologies, are described. The three different doping profiles are simulated for various interconnect distances and different metal layers assuming a 65 nm bulk CMOS technology. A proper data analysis methodology is presented, including...
In this work, a new automated method for determining the substrate resistance is presented. It exploits a geometric formulation of the current streamlines between coupled structures and builds an analytical model for the substrate resistance. Both simulation and measurement data are utilized in order to show the validity of the proposed scheme. The measurement data are obtained from a fabricated test...
A new technique for driving silicon-on-insulator pixel matrixes has been proposed in |1|, which was based on transient charge pumping for evacuating the extra photo-generated charges from the body of the transistor. An 8x8 pixel matrix was designed and fabricated using the above technique. In this paper, the measurement set-up is described and the performance evaluation procedure is given, together...
In this paper a test method based on the wavelet transformation of the measured signal, be it supply current (Ips) or output voltage (Vout) waveform, is presented. In the wavelet analysis, a Mahalanobis distance test metric is introduced utilizing information from the wavelet energies of the first decomposition level of the measured signal. The tolerance limit for the good circuit is set by statistical...
Spiralne cewki scalone stanowią szczególny przypadek połączenia wewnątrzukładowego w układach scalonych. Pozwalają na bezpośrednią integrację indukcyjności w strukturach półprzewodnikowych, w standardowych technologiach CMOS/BiCMOS, bez konieczności wykonywania dodatkowych procesów technologicznych, dodatkowych fotomasek, a tym samym, bez zwiększania kosztów produkcji. W niniejszym artykule przedstawiono...
The testing of an optical feedback pixel driver is discussed and simulated by HSPICE. A basic characteristic of the specific circuit is the fact that the gray scales of the pixel are created by pulse width modulation. So, the integral of the output / pixel current (which is proportional to / oled) has to be measured or calculated and tested. The method that is presented enables the detection and identification...
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