Search results for: Chang Yong Kang
Metals and Materials International > 2012 > 18 > 3 > 451-455
Microelectronic Engineering > 2011 > 88 > 12 > 3411-3414
Microelectronic Engineering > 2011 > 88 > 12 > 3415-3418
Microelectronic Engineering > 2011 > 88 > 12 > 3399-3403
Microelectronic Engineering > 2011 > 88 > 12 > 3389-3392
Solid State Electronics > 2011 > 65-66 > Complete > 22-27
2011 International Reliability Physics Symposium > 5A.4.1 - 5A.4.5
2011 International Reliability Physics Symposium > XT.1.1 - XT.1.5
IEEE Electron Device Letters > 2011 > 32 > 4 > 434 - 436
IEEE Electron Device Letters > 2011 > 32 > 11 > 1474 - 1476
IEEE Electron Device Letters > 2011 > 32 > 5 > 686 - 688
IEEE Electron Device Letters > 2011 > 32 > 12 > 1668 - 1670
Metals and Materials International > 2011 > 17 > 6 > 931-935
2010 International Electron Devices Meeting > 16.1.1 - 16.1.4
IEEE Electron Device Letters > 2010 > 31 > 10 > 1104 - 1106
Current Applied Physics > 2010 > 10 > 1 Supplement > e27-e31