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Diffusion-induced recrystallization (DIR) is a mechanism which destabilizes thin film multilayers. New grains formed are distinguished by preferred composition levels characteristic for the diffusion couple. By evaluating these concentrations for different material combinations, it is demonstrated that a break of coherency by spontaneous relaxation is the key to understanding the DIR process. Based...
The interdiffusion of Pd–Ag thin film diffusion couples is investigated by transmission electron microscopy and X-ray diffractometry at a temperature of 723K. By comparison with calculated diffractograms, it is shown that a diffusion-induced recrystallization takes place, which produces a first generation of new grains with a dominant composition of 24.5at.% Pd inside the diffusion zone.
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