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We propose two procedures to extract information about the trapping processes that occur in organic thin film transistors (OTFTs) that exhibit both contact and hysteresis effects. In particular, the variation of trapped charge during hysteresis cycles is determined by the separate analysis of current–voltage curves for the intrinsic transistor and for the contact region. The extraction of these curves...
A new compact model is developed for organic thin film transistors (OTFTs) by incorporating the effects of the contacts on the transistor’s output characteristics. The model is based on physically realistic expressions that describe charge flow in the vicinity of the contacts and a previously developed drift model. The resulting new model maintains the compactness of our original drift-based model...
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