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We optimize the disaster backup in multi-datacenter (multi-DC) cloud systems and design disaster-aware algorithms to realize rapid backup with the objective of minimizing the backup window for all the DCs in the network. A mixed integer linear programming (MILP) model is first formulated to optimize the backup processes of all production DCs jointly. We then develop three heuristics that use the one-step...
One of the major challenges in big data processing is the efficiency of cross join, such as the similarity calculation in business intelligence. In this paper we introduce an optimal data distribution algorithm for distributed cross join which combine each row from the first table with each row from the second table, which can reduce the network traffic and guarantee the computation balance of the...
We present simulation and experimental results proving the feasibility of a novel concept to increase efficiency of CdTe based solar cells. In order to achieve $0.50/W price in CdTe based modules, higher efficiencies need to be attained. The high defect density due to lattice-mismatch between CdS and CdTe reduces lifetime, voltage, and efficiency of the cells. We propose the use of a graded composition...
Based on horizontal and vertical information of decision, this paper firstly aggregates decision-makers' judgment in single stage to gain in-stage decision-makers' preference and weight, and to compute the preference of groups. Secondly, satisfied preference and stage weight of decision-makers between stages are calculated out according to preference distance model. Finally, the optimized judgment...
A novel virtual platform is presented, providing CAD/CAT support for efficient test development and attempting to bridge the gap between design and test. The platform, which models and simulates the entire test environment, provides methodologies, model libraries and tool sets to enable design, debug and verification of all test relevant processes including fault analysis, test algorithm, load board...
Virtual test (VT) is a promising technique that facilitates test development and cuts time-to-market especially for analog/mixed-signal/RF devices. While the concept has been around for more than a decade and its benefits are widely acknowledged, to date it has not become a standard technique in the day-to-day business of test development. The major difficulties are: weak integration between test...
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