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We have investigated the oxidation of Cr(110) at 330°C and high oxygen exposures by surface sensitive X-ray scattering. Single crystal Cr(110) films prepared by molecular beam epitaxy (MBE) were used. Via in-situ X-ray reflectivity measurements the exact oxide thickness could be determined. New information about the metal/oxide interface was obtained: the oxidation is proceeding without roughening...
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