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Thin films of Cu 2 SnSe 3 , a potential candidate for acousto-optic device applications in IR region were prepared by co-evaporation onto glass substrates. Powder X-ray diffraction (XRD) pattern revealed that the films were polycrystalline in nature with sphalerite structure. The lattice parameter was found to be a=0.573nm. Grazing incidence X-ray diffraction (GIXRD) studies indicated...
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