Search results for: Yong-Bin Kim
IEEE Transactions on Industrial Informatics > 2008 > 4 > 2 > 134 - 143
Journal of Electronic Testing > 2008 > 24 > 1-3 > 271-284
Neurocomputing > 2007 > 71 > 1-3 > 284-296
2007 50th Midwest Symposium on Circuits and Systems > 1161 - 1164
2007 50th Midwest Symposium on Circuits and Systems > 1336 - 1339