Wyniki wyszukiwania dla: Yong-Bin Kim
IEEE Transactions on Instrumentation and Measurement > 2010 > 59 > 5 > 1127 - 1133
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2009 > 17 > 4 > 517 - 528
IEEE Design & Test of Computers > 2007 > 24 > 4 > 322 - 330
48th Midwest Symposium on Circuits and Systems, 2005. > 1350 - 1353 Vol. 2