Search results for: Yong-Bin Kim
Integration, the VLSI Journal > 2010 > 43 > 2 > 176-187
IEEE Transactions on Instrumentation and Measurement > 2010 > 59 > 5 > 1127 - 1133
IEEE Transactions on Instrumentation and Measurement > 2009 > 58 > 2 > 401 - 410
2008 International SoC Design Conference > 1 > I-176 - I-179
IEEE Design & Test of Computers > 2007 > 24 > 4 > 322 - 330