Search results for: Yong-Bin Kim
2016 International SoC Design Conference (ISOCC) > 283 - 284
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 5 > 900 - 904
IEEE Transactions on Instrumentation and Measurement > 2010 > 59 > 5 > 1127 - 1133
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2009 > 17 > 4 > 517 - 528
IEEE Transactions on Instrumentation and Measurement > 2009 > 58 > 2 > 401 - 410
IEEE Design & Test of Computers > 2007 > 24 > 4 > 322 - 330