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Ce/Ti/Zr mixed oxide thin films were prepared using sol–gel process with mole ratios from 45/5 to 5/45 of Ti/Zr and 50 of Ce and deposited by dip coating technique. Optical, electrochromic, and structural properties of such films were investigated. The thickness, refractive index, and extinction coefficient of the films were calculated through transmission and reflection measurement by an nkd spectrophotometer...
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