The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
The Mn and Fe deposited clean Si(111) substrates were examined with UHV-TEM and STM that are part of an UHV-TEM/STM integrated characterization system. The Mn deposition with coverages of 5-20 ML followed by annealing at 673 K for 5 min formed MnSi islands. STM image revealed their surface √3x√3 structure. The re-deposition of 10-20 ML Mn and re-annealing at 573 K for 5 min succeeded to transform...
Mn was deposited on Si(111) 7x7 surface at room temperature in an ultrahigh vacuum (UHV) chamber and then transferred to a UHV transmission electron microscope through a UHV transportation system, followed by investigation of changes in crystallographic structure and electronic structure of the deposited Mn layer before and after annealing at about 400 o C. Transmission electron microscopy...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.