Search results for: Z. Ji
2015 IEEE International Reliability Physics Symposium > 3F.1.1 - 3F.1.7
2013 IEEE International Electron Devices Meeting > 15.6.1 - 15.6.4
IEEE Electron Device Letters > 2012 > 33 > 4 > 480 - 482
IEEE Electron Device Letters > 2012 > 33 > 12 > 1681 - 1683