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At-speed scan testing has become mandatory due to the extreme CMOS technology scaling. The two main at-speed scan testing schemes are namely Launch-Off-Shift (LOS) and Launch-Off-Capture (LOC). As it can be easily implemented, LOC has been widely investigated in the literature in the last few years, especially regarding test power consumption. Conversely, LOS has received much less attention. In this...
This paper presents a novel diagnosis method combining element-oriented Petri nets with temporal order information. With the use of element-oriented Petri nets with time-stamp, the proposed method models the protection system philosophy of crucial elements in power system, such as transmission lines, buses and transformers. The advantages of the approach involve the following aspects: Firstly, the...
A novel method of fault diagnosis is presented based on power grid flow fingerprint identification technology and synchronized phasor measurements. In this paper, the definitions of power grid flow fingerprint and flow fingerprint characteristic point are introduced at first. Then, the proposed method is achieved utilizing the flow fingerprint identification scheme. Meanwhile, two evaluation indexes...
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