Search results for: T. Kim
IEEE Transactions on Plasma Science > 2016 > 44 > 9-1 > 1529 - 1533
2016 IEEE International Reliability Physics Symposium (IRPS) > DI-4-1 - DI-4-3
IEEE Journal of Solid-State Circuits > 2016 > 51 > 1 > 18 - 30
2015 International SoC Design Conference (ISOCC) > 121 - 122
IEEE Journal of Solid-State Circuits > 2015 > 50 > 8 > 1809 - 1819