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In an operation mode of atomic force microscopy that uses a higher eigenmode to determine the physical properties of material surface, the ratio between the eigenfrequency of a higher flexural eigenmode and that of the first flexural eigenmode was identified as an important parameter that affects the sensitivity and accessibility. Structure features such as cut-out are often used to tune the ratio...
Higher harmonics signal in tapping mode atomic force microscope (AFM) topography imaging process is verified to be an evidence for material mapping in sample surface. Due to low amplitude and rapid decay of higher harmonics, structure design focused on cantilever probe is proposed to optimize the frequency response performance of probe. Here, we utilize concentrated masses to tune the ratio between...
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