Search results for: C.Y. Chen
Electronics Letters > 1985 > 21 > 24 > 1136 - 1138
IEEE Transactions on Reliability > 1983 > R-32 > 5 > 492 - 495
Electronics Letters > 1985 > 21 > 24 > 1136 - 1138
IEEE Transactions on Reliability > 1983 > R-32 > 5 > 492 - 495