Search results for: R. Rodríguez
IEEE Electron Device Letters > 2010 > 31 > 6 > 543 - 545
2009 IEEE International Reliability Physics Symposium > 1028 - 1032
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 454 - 458
IEEE Electron Device Letters > 2010 > 31 > 6 > 543 - 545
2009 IEEE International Reliability Physics Symposium > 1028 - 1032
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 454 - 458