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This paper describes a new test method called Capacitively Coupled Transmission Line Pulsing cc-TLP. It is applied to different test circuits which were mounted on specially designed package emulators with a defined background capacitance. The test results are compared with the ESD thresholds obtained by CDM tests. The CC-TLP results correlate well with the CDM data.
A traceable low-voltage network analysis in the time and frequency domain is introduced for the arc-free characterization of CDM testers and their metrology chains. An improved tester circuit model is derived from step responses.
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