Search results for: A. Alam
2016 IEEE International Electron Devices Meeting (IEDM) > 15.7.1 - 15.7.4
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 489 - 496
2016 IEEE International Electron Devices Meeting (IEDM) > 15.7.1 - 15.7.4
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 489 - 496