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The effectiveness and the efficiency of functional ATPGs based on deterministic strategies is influenced by the computational model adopted to represent the design under test. In this context the extended finite state machine (EFSM) is a valuable model which reduces the risk of state explosion preserving relevant features of more traditional FSMs. This paper. defines a particular variant of EFSMs...
This paper presents LIFTING (LIRMM fault simulator), an open-source simulator able to perform both logic and fault simulations for single/multiple stuck-at faults and single event upset (SEU) on digital circuits described in Verilog. Compared to existing tools, LIFTING provides several features for the analysis of the fault simulation results, meaningful for research purposes. Moreover, as an open-source...
Static linked faults are considered an interesting class of memory faults. Their capability of influencing the behavior of other faults causes the hiding of the fault effect and makes test algorithm design a very complex task. A large number of March tests with different fault coverage have been published and some methodologies have been presented to automatically generate March tests. In this paper...
The effect of single-event transients (SETs) (at a combinational node of a design) on the system reliability is becoming a big concern for ICs manufactured using advanced technologies. An SET at a node of combinational part may cause a transient pulse at the input of a flip-flop and consequently is latched in the flip-flop and generates a soft-error. When an SET conjoined with a transition at a node...
Linked faults are considered an interesting class of memory faults. Their capability of influencing the behavior of other faults causes the hiding of the fault effect and makes test algorithm design a very complex task. Although several March tests have been developed for the wide memory faults spread, a few of them are able to detect linked faults. In the present paper March AB, a March test targeting...
Among the different types of algorithms proposed to test static random access memories (SRAMs), March tests have proven to be faster, simpler and regularly structured. New memory production technologies introduce new classes of faults usually referred to as dynamic memory faults. A few March tests for dynamic fault, with different fault coverage, have been published. In this paper, we propose new...
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