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Advanced computing systems realized in forthcoming technologies hold the promise of a significant increase of computational capabilities. However, the same path that is leading technologies toward these remarkable achievements is also making electronic devices increasingly unreliable. Developing new methods to evaluate the reliability of these systems in an early design stage has the potential to...
Among all means to attack a security dedicated circuit, fault injection by means of laser illumination is a very efficient one. The laser beam creates electrons/holes pairs along its way through silicon. Collection of these charges creates a transient current and thus may induce a fault in the circuit. Nevertheless the collection efficiency depends on various parameters including the technology used...
Due to the shrinking of transistors dimensions in nowadays technologies, circuits are more and more sensitive to aging phenomenon, as well as soft errors. Furthermore cryptographic circuits are prone to fault attacks, which intend to retrieve secret data by mean of fault injection. Thus, concurrent fault detection is of prime interest for such crypto devices. The purpose of this paper is to compare...
In nowadays technologies, circuits are more and more sensitive to aging phenomenon, as well as soft errors. Furthermore several attacks that used a fault to derive secret information have been demonstrated on cryptosystems. Concurrent fault detection is thus of prime interest for such systems. The purpose of this paper is to compare several code-based concurrent fault detection schemes dedicated to...
Verification via fault injection and fault simulation is a widely adopted technique to evaluate the correctness of a design implementation. However, the complexity of industrial designs and the huge number of faults that must be injected into them require efficient fault simulators, in order to make verification via fault simulation an affordable task. To optimize fault simulation performances, some...
In this paper we propose an on-line fault detection architecture for bijective Substitution Boxes used in cryptographic circuits. Concurrent fault detection is important not only to protect the encryption/decryption process from random and production faults, it also protects the system against side-channel attacks, in particular those based on fault injection. We will prove that our solution is very...
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