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To guarantee that an application specific integrated circuits (ASIC) meets its timing requirement, at-speed scan testing becomes an indispensable procedure for verifying the performance of ASIC. However, at-speed scan test suffers the test-induced yield loss. Because the switching activity in test mode is much higher than that in normal mode, the switching-induced large current drawn causes severe...
In recent years, pre-fabricated design styles grow up rapidly to amortize the mask cost. However, the interconnection delay of the pre-fabricated design styles slows down the circuit performance due to the high capacitive load. In this paper, we propose a technique to insert dual-rail wires for pre-fabricated design styles. Furthermore, we propose an effective dual-rail insertion algorithm to reduce...
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