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Here we report on two different approaches, which allow rapid photoluminescence imaging of dislocation‐related D1, and band‐to‐band radiation on multicrystalline solar cell wafers at room temperature. We compared a new light emitting diode based method with the recently introduced pulsed laser based method. With both techniques we obtained spatially resolved images from 15.6 × 15.6 cm2 wafers originating...
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