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Defects and cracks in thin film barriers that are coated on polymers allow the leakage of reactive species through the polymer substrate. Fluorescent tags have been developed to visualize defects and cracks in thin film barriers and to inspect rapidly the barrier quality with minimal sample preparation. For Al 2 O 3 films with a thickness of 25 nm deposited on polyethylene naphthalate...
Thin films grown using atomic layer deposition (ALD) are known for being continuous and nearly pinhole-free. These characteristics enable ALD films to be important in many applications such as gas or copper diffusion barriers, gate dielectrics, surface modification and functionalization layers. Few methods have been demonstrated to characterize defects in ALD films. In this study, a method to render...
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