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The Gate-Induce-Drain-Leakage (GIDL)-assisted body biasing for erase, which is a technique essential to enabling 3DNAND Flash CMOS Under Array architectures, has been extensively studied and successfully optimized to achieve high-performance, reliable erase operation. This paper reviews the main features of GIDL-assisted body biasing and GIDL optimization methods ensuring the best erase effectiveness...
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