Search results for: M. Houssa
Microelectronic Engineering > 2005 > 80 > Complete > 130-133
Materials Science in Semiconductor Processing > 2005 > 8 > 1-3 > 203-207
Microelectronics Reliability > 2005 > 45 > 1 > 3-12
Microelectronic Engineering > 2004 > 72 > 1-4 > 90-95
Journal of Non-Crystalline Solids > 2003 > 322 > 1-3 > 100-104
Journal of Non-Crystalline Solids > 2003 > 322 > 1-3 > 219-224
Applied Surface Science > 2003 > 212-213 > Complete > 749-752
Journal of Non-Crystalline Solids > 2002 > 303 > 1 > 69-77
Journal of Non-Crystalline Solids > 2002 > 303 > 1 > 162-166
Journal of Non-Crystalline Solids > 2002 > 303 > 1 > 144-149
Microelectronic Engineering > 2001 > 59 > 1-4 > 367-371
Microelectronic Engineering > 2001 > 59 > 1-4 > 335-339
Microelectronics Reliability > 2001 > 41 > 7 > 995-998
Solid State Electronics > 2000 > 44 > 3 > 521-525
Thin Solid Films > 2000 > 359 > 2 > 197-202
Solid State Electronics > 1999 > 43 > 1 > 159-167
Zeitschrift für Physik B Condensed Matter > 1997 > 101 > 3 > 353-357
Physica C: Superconductivity and its applications > 1996 > 267 > 1-2 > 24-30
Physica C: Superconductivity and its applications > 1996 > 265 > 3-4 > 258-266
Physica C: Superconductivity and its applications > 1996 > 257 > 3-4 > 321-331