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In this paper, the statistical properties of pixel displacements in turbulence degraded images are analyzed. Two main problems are addressed before that. One is the computation of pixel displacements. Dense optical flow is used since blur makes features like points and edges hard to track. The other one is selection of statistical samples. We use 2D-Hilbert transform to extract feature points, and...
Although Total Ionizing Dose (TID) effects are generally unpronounced in deep-submicron-CMOS, we show the TID-induced leakage current @TID=500Krad is significant in NMOS-finger-transistors of GlobalFoundries 65nm CMOS. Further, Radiation-Hardening-By-Design techniques against said TID effect are recommended.
Subthreshold voltage references are increasingly prevalent in power-critical applications due to their low-voltage and ultra-low-power attributes. However, the effective temperature range of state-of-the-art subthreshold voltage references remains undesirably narrow for low temperature coefficient (TC) operation and/or their PSRR is low — thereby severely limiting their range of applications. In this...
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