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The optical constants of Cd 0.2 Zn 0.8 Te thin films deposited at different substrate temperatures are calculated in the wavelength range 400-2500nm. Some parameters which affect these optical properties of thin films, such as the film thickness, substrate temperature are also investigated. Effective crystallite size and strain are determined by the method of variance...
Thin films of Cd 0.8 Zn 0.2 Te/Si structures were prepared by vacuum evaporation technique. The electrical properties such as activation energy, barrier height, and transport mechanism along with the capacitance-voltage characteristics are analyzed. The zero field activation energy calculated from the saturation current density with the inverse absolute temperature...
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