Wyniki wyszukiwania dla: Feng Wu
Microelectronics Reliability > 2017 > 75 > C > 309-316
IEEE Transactions on Power Electronics > 2017 > 32 > 5 > 3935 - 3945
IEEE Transactions on Power Electronics > 2017 > 32 > 5 > 3731 - 3740
Electronics Letters > 2016 > 52 > 21 > 1795 - 1797
IEEE Transactions on Power Electronics > 2016 > 31 > 2 > 1425 - 1437
Electronics Letters > 2015 > 51 > 21 > 1688 - 1690