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A series of Co2FeAl0.5Si0.5 (CFAS) films sandwiched by Pd and MgO layers are sputtered and subsequently annealed at various temperatures. Perpendicular magnetic anisotropy is shown to build in the structures with CFAS thickness ranging from 3 to 4.25nm after annealing. The thickness of a magnetic dead layer and the saturation magnetization are shown to increase with the annealing temperature. Perpendicular...
CoFeAlSi alloy films are sputtered at room temperature and annealed at various temperatures. X-ray diffraction measurements reveal as-deposited films are amorphous and a nanocrystalline structure is formed after annealing. The coercivity is found to rapidly increase with the annealing temperature, in line with the grown nanocrystalline grain size. The angle dependent magnetic measurements reveal a...
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