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The planar waveguide was formed in an x-cut Nd:YVO4 crystal by 3.0 MeV Si+ ion implantation at a dose of 1times1015 ions/cm2 at room temperature. The effective refractive indices of the waveguide propagation modes were measured by using a prism-coupling method after the annealing at 240degC for 60 min in air. Reflectivity calculation method (RCM) was applied to simulate the refractive index profile...
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