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Selected area electron diffraction pattern (SADP) and high-resolution transmission electron microscopy (HRTEM) measurements were carried out to investigate the existence and the atomic arrangement of microtwins in CdTe epilayers grown on GaAs (211) B substrates by using molecular beam epitaxy. The SADP results showed that an epitaxial relationship between the CdTe epilayer and the GaAs substrate was...
Two variants of CuPt B -type orderings in strained Cd x Zn 1-x Te epilayers were investigated by using transmission electron microscopy (TEM) and selected area diffraction pattern (SADP) measurements. The TEM images on the Cd 0.15 Zn 0.85 Te epilayers depicted strong contrast modulations along the [110] direction, and...
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