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In situ tensile testing has been performed on thin gold film, 320 nm thick, deposited on polyimide substrates. During the tensile testing, strain/stress measurements have been carried out by X-ray diffraction using the d-sin 2 ψ method. The X-ray stress analysis suggests crack formation in the films for stresses greater than 670 MPa. The surface of the deformed specimen observed by atomic...
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