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A photonic-based phased array antenna (PAA) with ultra-fast beam scan is proposed and experimentally demonstrated using dispersion-based true time delay lines. The ultra-fast angle scan is realized using an ultra-fast wavelength-swept laser source which is constructed by a gated multi-wavelength laser (MWL) and a dispersion compensation fiber (DCF). The wavelength switching time is about several nanoseconds...
In this paper a yield-aware template-based analog layout retargeting methodology for lithography-friendly nanometer technology designs is proposed. The yield performance is evaluated by probability of failure (POF), which is independent of any specific defect size, and is improved by wire-widening and wire-shifting inside the retargeting process. The non-traditional design rules, which are becoming...
Photolithographic defects during manufacture cannot only result in significant yield loss in digital integrated circuits, but are also deemed as an important factor in evaluating the quality of analog layouts. In this paper, we propose a graph-based lithography-aware analog layout retargeting methodology. We build up our fault model based on a classical defect size distribution function, geometrical...
Lithographic effects have long been a primary yield consideration during integrated circuit (IC) manufacture. Especially the random spot defects may easily lead to functional failures across the chip. In this paper, a lithography-friendly analog layout migration flow is proposed. The optimization is achieved by intelligent redundant space utilization, which includes wire widening and wire shifting...
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