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Structural characterisation of amorphous or partially amorphous thin films can be carried out by X-ray absorption spectroscopy in its X-ray absorption near-edge structure (XANES) and extended X-ray absorption fine structure (EXAFS) approaches. The EXAFS spectra have been analysed using the FEFF procedure, while XANES spectra are dealt with on a fingerprint basis. PbTiO 3 and CoO/Co 3 ...
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