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Both Kelvin Probe Force Microscopy and Scanning Electron Microscopy enable assessment of the effect of electrical bias on the surface potential of the layers of a solar cell. We report on a comprehensive comparison of surface potential measurements on an interdigitated back contact solar cell using these two techniques. Measurements under different values of electrical biases are performed on and...
The use of Kelvin Probe Force Microscopy to investigate PN junctions under illumination and electrical bias has been shown to be an effective way to analyze the electrical properties of solar cells at the nanoscale. We use it here, for the first time, on interdigitated back contact solar cells. Measurements are performed between the metallic fingers under an electrical bias in the dark and under illumination...
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