Search results for: T. Siegmund
Microelectronic Engineering > 2008 > 85 > 2 > 477-485
International Journal of Fatigue > 2005 > 27 > 10-12 > 1328-1334
International Journal of Fracture > 2005 > 132 > 2 > 175-196
Engineering Fracture Mechanics > 2003 > 70 > 2 > 209-232