Search results for: W. Sun
2016 IEEE International Reliability Physics Symposium (IRPS) > CD-3-1 - CD-3-6
Microelectronics Reliability > 2016 > 56 > C > 37-44
IEEE Transactions on Applied Superconductivity > 2013 > 23 > 3-2 > 5600704
IEEE Electron Device Letters > 2012 > 33 > 3 > 339 - 341