Search results for: Paula O'Sullivan
Microelectronics Reliability > 1997 > 37 > 8 > 1279
Microelectronics Journal > 1996 > 27 > 7 > 633-645
Microelectronics Reliability > 1996 > 36 > 3 > 442
Microelectronics Reliability > 1997 > 37 > 8 > 1279
Microelectronics Journal > 1996 > 27 > 7 > 633-645
Microelectronics Reliability > 1996 > 36 > 3 > 442